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Genome-wide analyses of the Dutch elm disease fungi

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Bernier, Louis

Year Published

2017

Publication

In: Pinchot, Cornelia C.; Knight, Kathleen S.; Haugen, Linda M.; Flower, Charles E.; Slavicek, James M., eds. Proceedings of the American elm restoration workshop 2016; 2016 October 25-27; Lewis Center, OH. Gen. Tech. Rep. NRS-P-174. Newtown Square, PA: U.S. Department of Agriculture, Forest Service, Northern Research Station: 6-20.

Abstract

The Ascomycete fungi Ophiostoma ulmi and O. novo-ulmi are the pathogens respectively responsible for the two successive pandemics of Dutch elm disease (DED) since the early 1900s. The advent of the highly fit and virulent O. novo-ulmi was a landmark event in the evolution of DED during the last 100 years. This, however, may not be the last major shift in the behavior of the pathogen and elm breeders must keep in mind this possibility as it bears consequences for ongoing elm improvement programs. This contribution reviews some of the current knowledge on the biology of the DED fungi, including findings from genome-wide analyses carried out during the last decade. Biological traits believed to be important for parasitic fitness of O. novo-ulmi are presented. Events that might allow the DED fungi to evolve further are proposed and discussed in the context of elm resistance breeding.

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Citation

Bernier, Louis. 2017. Genome-wide analyses of the Dutch elm disease fungi. In: Pinchot, Cornelia C.; Knight, Kathleen S.; Haugen, Linda M.; Flower, Charles E.; Slavicek, James M., eds. Proceedings of the American elm restoration workshop 2016; 2016 October 25-27; Lewis Center, OH. Gen. Tech. Rep. NRS-P-174. Newtown Square, PA: U.S. Department of Agriculture, Forest Service, Northern Research Station: 6-20.

Last updated on: September 26, 2017